Scanning Probe Microscopy – Physical Property Characterization
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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Nano hexagonal wurtzite ZnO has been prepared on zeoliteA by the sono-chemical method. The zeoliteA was mixed into Zinc gel, after stirring for two days, the mixture was irradiated 30 min by ultrasonic probe. The filtrated composite gel was calcinated at 500°C for 3h in furnace. The produced composite was characterized using X-ray diffraction, FT-IR spectroscopy and field emission scanning elec...
متن کاملSonosynthesis, characterization and photocatalytic degradation property of nanoZnO/zeoliteA
Nano hexagonal wurtzite ZnO has been prepared on zeoliteA by the sono-chemical method. The zeoliteA was mixed into Zinc gel, after stirring for two days, the mixture was irradiated 30 min by ultrasonic probe. The filtrated composite gel was calcinated at 500°C for 3h in furnace. The produced composite was characterized using X-ray diffraction, FT-IR spectroscopy and field emission scanning elec...
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تاریخ انتشار 2017